发明名称 |
CENTRALIZED CONTROL ARCHITECTURE FOR A LASER MATERIALS PROCESSING SYSTEM |
摘要 |
Apparatus, systems, and methods for monitoring the processing of a workpiece that includes directing an incident laser beam onto the workpiece and using an optical detector for measuring a signal emitted from the workpiece as a result of the incident laser beam. The detector generates at least two signals based upon the optical signal. The method also involves use of a light source monitor in determining workpiece processing quality based upon the quotient of the two outputs as well as a magnitude of one of the two quotients.
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申请公布号 |
KR20060011944(A) |
申请公布日期 |
2006.02.06 |
申请号 |
KR20057018542 |
申请日期 |
2005.09.30 |
申请人 |
HYPERTHERM, INC. |
发明人 |
PICARD TATE S.;WOODS KENNETH J.;YOUNG ROGER E. JR.;CONNALLY WILLIAM J. |
分类号 |
B23K26/03;B23K10/00;B23K26/00;B23K26/14;B23K26/38;B23K37/02;G06F19/00 |
主分类号 |
B23K26/03 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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