发明名称 Insulated gate semiconductor device
摘要 <p>An insulated gate semiconductor device, includes an isolating structure (8) shaped in a circulating section along the periphery of a semiconductor substrate (10) so as to isolate that part from an inside device region, a peripheral diffusion region (9) of the semiconductor substrate located outside the isolating structure, a plurality of cell structures defined in the device region and divided in segments by insulated trench-shaped gates (3) so as to have a base region (6) covered with an emitter region (5) in its upper surface, a collector region, and an emitter electrode (1) electrically connected to the emitter region and the base region, a dummy base region (7) contiguous to the cell structures and configured as a base region that has its upper surface left without the emitter region connected to the emitter electrode, and a connection part (15) to electrically connect the peripheral diffusion region to the emitter electrode.</p>
申请公布号 EP1608024(A2) 申请公布日期 2005.12.21
申请号 EP20050013117 申请日期 2005.06.17
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 TERAMAE, SATOSHI;HASEGAWA, SHIGERU;NINOMIYA, HIDEAKI;TANAKA, MASAHIRO
分类号 H01L29/739;H01L21/336;H01L29/06;H01L29/10;H01L29/417;H01L29/76;(IPC1-7):H01L29/739 主分类号 H01L29/739
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