发明名称 Timing generator and semiconductor testing device
摘要 Pattern-dependent jitters are reduced, and timing errors of timing pulse signals are decreased in a timing generator. In a timing generator 20 , a delaying circuit (variable delaying means, clock signal delaying circuit) 32 is disposed on an input terminal side of a clock signal, not an output terminal side of a flip-flop 31 in a signal input/output circuit 30 having the flip-flop (reference signal delaying means) 31 which outputs an output signal in accordance with an input timing of the clock signal, and the clock signal is delayed. The clock signal delaying circuit 32 may be replaced with a phase locked loop circuit 34.
申请公布号 US2005273684(A1) 申请公布日期 2005.12.08
申请号 US20050126038 申请日期 2005.05.10
申请人 OCHI TAKASHI 发明人 OCHI TAKASHI
分类号 G01R31/28;G01R31/317;G01R31/3183;G01R31/319;G06F11/00;(IPC1-7):G06F11/00 主分类号 G01R31/28
代理机构 代理人
主权项
地址