发明名称 |
COMPOSITION FOR POLISHING |
摘要 |
<p>[PROBLEMS] To provide an abrasive material for use in polishing for planarization in semiconductor device production steps and for use in a step for the separation of semiconductor device elements. [MEANS FOR SOLVING PROBLEMS] The composition for polishing comprises an ingredient (A) which is a water-soluble organic compound having a carboxy group or a salt thereof and an ingredient (B) which is an aqueous sol of cerium oxide particles obtained by burning a cerium compound by holding it in at least two different burning temperature ranges and wet-pulverizing the resultant cerium oxide powder until it comes to have a ratioof [the average particle diameter (b1) as measured by laser diffractometry]/[the average particle diameter (b2) as determined from specific surface area measured by the gas adsorption method] in the range of either 1-4 or 15-40. The ingredient (A) may be ammonium acrylate, ammonium methacrylate, an amino acid, or an amino acid derivative. The ingredient (B) may be obtained by wet-pulverizing the cerium oxide powder obtained from a cerium compound through a burning step which has a burning temperature range of 200-350°C and a burning temperature range of 400-550°C or 700-850°C.</p> |
申请公布号 |
WO2005110679(A1) |
申请公布日期 |
2005.11.24 |
申请号 |
WO2005JP08890 |
申请日期 |
2005.05.16 |
申请人 |
NISSAN CHEMICAL INDUSTRIES, LTD.;OTA, ISAO;TANIMOTO, KENJI;TAKAKUMA, NORIYUKI |
发明人 |
OTA, ISAO;TANIMOTO, KENJI;TAKAKUMA, NORIYUKI |
分类号 |
B24B37/00;C09G1/02;C09K3/14;H01L21/304;(IPC1-7):B24B37/00 |
主分类号 |
B24B37/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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