| 摘要 |
FIELD: measurement technology. ^ SUBSTANCE: the proposed method consists in realization of the following operations: a sample under investigation is positioned into the gap of a plane static capacitor with immovable plates; the harmonic mechanical oscillations of the sample are excited in the direction of a normal to the capacitor plates; measurement of the signal value, proportional to the current in the capacitor circuit at zero voltage on the capacitor, is carried out. Then an alternating voltage, common-mode with mechanical oscillations of the samples, is supplied to the capacitor gaps and the signal value, proportional to the current in the capacitor circuit, is measured again. The value of the charge surface density is calculated when using the alternating voltage amplitude, sample oscillation amplitude and measured values of the signal, proportional to the current in the capacitor circuit. ^ EFFECT: repeated decrease of the voltage on a measuring capacitor in comparison with the methods, based on application of a dynamic measuring capacitor. ^ 1 cl, 1 dwg |
