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发明名称
Probe card for testing semiconductor
摘要
申请公布号
KR200394134(Y1)
申请公布日期
2005.08.30
申请号
KR20050017466U
申请日期
2005.06.17
申请人
发明人
分类号
H01L21/66;(IPC1-7):H01L21/66
主分类号
H01L21/66
代理机构
代理人
主权项
地址
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