发明名称 Method of forming buried wiring in semiconductor device
摘要 A method of forming buried wiring, includes the steps of forming an insulating layer having a trench on a semiconductor substrate; forming a conductive layer mainly composed of copper on the insulating layer in such a manner that the trench is filled with the conductive layer; removing an oxide layer generated in a surface of the conductive layer by oxidation; forming a cap layer made of a material having less mechanical strength than the oxide layer, on the conductive layer; and removing the cap layer and a part of the conductive layer by chemical mechanical polishing in such a manner that the conductive layer is left in the trench.
申请公布号 US2005186795(A1) 申请公布日期 2005.08.25
申请号 US20050109634 申请日期 2005.04.20
申请人 ABE KAZUHIDE 发明人 ABE KAZUHIDE
分类号 H01L21/3205;H01L21/302;H01L21/304;H01L21/44;H01L21/4763;H01L21/768;(IPC1-7):H01L21/476 主分类号 H01L21/3205
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