发明名称 Semiconductor device and manufacturing method thereof
摘要 In a crystallization process of an amorphous semiconductor film, a first crystalline semiconductor film having crystalline regions, and dotted with amorphous regions within the crystalline regions, is obtained by performing heat treatment processing after introducing a metallic element which promotes crystallization on the amorphous semiconductor film. The amorphous regions are kept within a predetermined range by regulating the heat treatment conditions at this point. Laser annealing is performed on the first crystalline semiconductor film, to form a second crystalline semiconductor film. Electrical characteristics for a TFT manufactured based on the second crystalline semiconductor film can be obtained having less dispersion.
申请公布号 US6916693(B2) 申请公布日期 2005.07.12
申请号 US20010799373 申请日期 2001.03.05
申请人 SHARP KABUSHIKI KAISHA 发明人 OHNUMA HIDETO;KOKUBO CHIHO;TANAKA KOICHIRO;MAKITA NAOKI;TSUCHIMOTO SHUHEI
分类号 H01L21/20;H01L21/77;H01L21/84;H01L27/12;H01L29/04;(IPC1-7):H01L21/00 主分类号 H01L21/20
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