发明名称 Method of making small transistor lengths
摘要 Transistor gate linewidths can be made to be effectively smaller by etching a notch at the bottom of the gate to reduce the effective linewidth. This can be done by etching at a layer interface, such as a silicon-germanium interface in an over-etch step.
申请公布号 US6914009(B2) 申请公布日期 2005.07.05
申请号 US20010850853 申请日期 2001.05.07
申请人 LILL THORSTEN B.;KRETZ JITSKE 发明人 LILL THORSTEN B.;KRETZ JITSKE
分类号 H01L21/28;H01L21/311;H01L21/3213;(IPC1-7):H01L21/302 主分类号 H01L21/28
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