发明名称 Methods of forming semiconductor devices having multiple channel MOS transistors and related intermediate structures
摘要 In a method of manufacturing a semiconductor device, a preliminary active pattern including gate layers and channel layers is formed on a substrate. The gate layers and the channel layers are alternatively stacked. A hard mask is formed on the preliminary active pattern. The preliminary active pattern is partially etched using the hard mask as an etching mask to expose a surface of the substrate. The etched preliminary active pattern is trimmed to form an active channel pattern having a width less than a lower width of the hard mask. Source/drain layers are formed on exposed side faces of the active channel pattern and the surface. The gate layers are selectively etched to form tunnels. A gate encloses the active channel pattern and filling the tunnels. Related intermediate structures are also disclosed.
申请公布号 US2005112851(A1) 申请公布日期 2005.05.26
申请号 US20040974410 申请日期 2004.10.27
申请人 LEE SUNG-YOUNG;KIM SUNG-MIN;PARK DONG-GUN;OH CHANG-WOO;YUN EUN-JUNG 发明人 LEE SUNG-YOUNG;KIM SUNG-MIN;PARK DONG-GUN;OH CHANG-WOO;YUN EUN-JUNG
分类号 H01L21/00;H01L21/336;H01L29/78;(IPC1-7):H01L21/00 主分类号 H01L21/00
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