发明名称 METHOD AND APPARATUS FOR ANALYZING MATERIAL FOR FORMING ORGANIC ELECTRONIC ELEMENT
摘要 PROBLEM TO BE SOLVED: To provide a new analytic method for analyzing a membrane interface phenomenon in a case that an organic electronic element is formed using a material for forming the organic electronic element, and an analyzer therefor. SOLUTION: In the analytic method of the material for forming the organic electronic element using a spectrum measuring means utilizing a slab type light waveguide and a different king of two or above analytic means, an external element for causing a change with the elapse of time is applied to the material for forming the organic electronic element to output the tracking of the state change of the interface of the material for forming the organic electronic element and the light waveguide as spectrum data. The state change is subjected to time-base development to output analytic data acquired by measuring the change caused in the material for forming the organic electronic element at every stage by a different kind of the analytic means, and the spectrum data and the analytic data for every stage are outputted so as to be capable of being compared with each other. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005077246(A) 申请公布日期 2005.03.24
申请号 JP20030308072 申请日期 2003.08.29
申请人 DAINIPPON PRINTING CO LTD;SYSTEM INSTRUMENTS KK 发明人 ITO KIYOSHI;KURODA KOJI;TAKAHASHI KOZO;HORIUCHI MICHIO
分类号 G01N21/64;G01N21/27;G01N21/33;H01L51/50;H05B33/14;(IPC1-7):G01N21/27 主分类号 G01N21/64
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