| 摘要 |
PROBLEM TO BE SOLVED: To provide a test board device capable of dividing a DUT board. SOLUTION: This device is provided by improving a test board device to be electrically connected to a test head of an IC tester. The device is characterized by having a performance board to be electrically connected to the test head, having a positioning pin provided on the center, and having the DUT board to be electrically connected to the fringe of the performance board through a connector and electrically connected to a test object, divided and positioned relative to each division by positioning pins. COPYRIGHT: (C)2005,JPO&NCIPI
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