发明名称 Photomask with dies relating to different functionalities
摘要 A photomask having dies relating to different functionalities is disclosed. A photomask for performing lithography in conjunction with fabrication of one or more semiconductor devices includes one or more first semiconductor dies and one or more second semiconductor dies. Each first semiconductor die relates to first functionality having a first definition grade. Each second semiconductor die relates to second functionality different than the first functionality. The second functionality has a second definition grade at least substantially close to the first definition grade. For instance, the second definition grade may be identical to the first definition grade, or it may be immediately adjacent (i.e., sequentially related) to the first definition grade.
申请公布号 US6841313(B2) 申请公布日期 2005.01.11
申请号 US20020160453 申请日期 2002.05.31
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 TSAI FEI-GWO;HSIEH YEOU-HSIN;TU CHIH-CHIANG;KING YU-CHIN
分类号 G03F1/14;(IPC1-7):G03F9/00 主分类号 G03F1/14
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