| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To accurately detect abnormal changes in source voltage with respect to fluctuation such as variation in manufacturing processes without requiring a plurality of voltage detectors with different threshold characteristics, relating to an abnormal source voltage change detection circuit mounted in a semiconductor device. <P>SOLUTION: A power line 2 to which a circuit (e.g., the I/O circuit of a semiconductor device)likely to cause abnormal changes in source voltage is not connected has its source voltage VDDx divided to generate reference voltages Vref1-Vref4. The reference voltages Vref1-Vref4 are inputted respectively to inverters 13-16 having the same threshold characteristic and supplied with the source voltages VDD, VSS via power lines 10, 11 to which a circuit likely to cause abnormal changes in source voltage is connected, and the outputs of the inverters 13-16 are used as source voltage change detection signals. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p> |
