发明名称 SEMICONDUCTOR SUBSTRATE AND MANUFACTURING METHOD THEREOF
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor substrate and manufacturing method thereof whereby gettering can be performed more properly than conventional ones even when using a semiconductor wafer having such a structure as to provide a semiconductor layer for forming elements thereon on an insulation layer. SOLUTION: As shown in Fig.(a), in this semiconductor substrate, a single-crystal silicon layer 30 for forming elements thereon has an SOI structure wherein the layer 30 is provided on a silicon oxide film 20 covering a silicon substrate 10 used as a supporting substrate. Further, the single-crystal silicon layer 30 has diffusion regions 31 doped with boron. Moreover, each diffusion region 31 is separated from a region for forming thereon such elements as transistors (an element forming region), by using each thermal oxidation film 40 so formed as to contact it with each diffusion region 31. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004296900(A) 申请公布日期 2004.10.21
申请号 JP20030088876 申请日期 2003.03.27
申请人 DENSO CORP 发明人 OTSUKI HIROSHI
分类号 H01L21/762;H01L21/322;H01L21/76;(IPC1-7):H01L21/322 主分类号 H01L21/762
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