发明名称 |
MANIPULATOR AND PROBE DEVICE, SAMPLE FABRICATING DEVICE AND SAMPLE OBSERVING DEVICE USING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a manipulator for improving the operating rate of a device by shortening a time for stopping the device during replacing a probe. SOLUTION: An air lock room is provided in a vacuum chamber and the air lock room is connected to the vacuum chamber of a body with a vacuum bellows. A probe holder is mounted in the air lock room so that the probe is moved together with the air lock room by a moving mechanism provided on the body. The air lock chamber is evacuated through an exhaust port and the air lock room is partitioned from the vacuum chamber with a vacuum valve. The probe has a second moving mechanism so that it can be moved between the air lock room and the vacuum chamber. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2004279431(A) |
申请公布日期 |
2004.10.07 |
申请号 |
JP20040170765 |
申请日期 |
2004.06.09 |
申请人 |
HITACHI LTD |
发明人 |
MATSUSHIMA MASARU;UMEMURA KAORU;TOMIMATSU SATOSHI;KANETOMO MASABUMI |
分类号 |
G01N1/04;G01N1/28;H01L21/66;(IPC1-7):G01N1/04 |
主分类号 |
G01N1/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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