TEST DEVICE AND SETTING METHOD

摘要

A test device for testing an electronic device includes: a signal I/O section for inputting or outputting a test signal from/to a terminal of the electronic device; a channel selection memory for storing channel selection information; a setting condition memory for storing a setting condition and a channel selection memory address while correlating them; a setting condition extraction section for extracting the setting condition and the channel selection memory address from the setting condition memory; a selection information extraction section for extracting channel selection information from a channel selection memory according to the channel selection memory address extracted; and a setting condition supply section for supplying the setting condition and the channel selection information to the signal I/O section. When the signal I/O section is selected according to the channel selection information supplied, the signal I/O section sets the signal I/O section according to the setting condition supplied.