发明名称 |
METHOD AND PAD FOR POLISHING WAFER |
摘要 |
<p>A method for polishing a wafer effectively preventing a sag in an outer peripheral portion of a wafer and a polishing pad for polishing a wafer preferably used in the method for polishing a wafer are provided. The method for polishing a wafer comprises the step of: mirror-polishing a wafer with a main surface of the wafer being in contact with a polishing pad of non-woven fabric impregnated with resin, wherein a ratio of surface roughness of the polishing pad to compressibility thereof äsurface roughness Ra ( mu m)/compressibility (%)ü is 3.8 or more. <IMAGE></p> |
申请公布号 |
EP1441386(A1) |
申请公布日期 |
2004.07.28 |
申请号 |
EP20020773017 |
申请日期 |
2002.10.25 |
申请人 |
SHIN-ETSU HANDOTAI CO., LTD;RODEL NITTA COMPANY |
发明人 |
MASUMURA, H.;TOMII, KAZUYA;ITO, SHIGENAO;ANZAI, KENICHI;INOUE, KENICHI |
分类号 |
B24B1/00;B24B7/30;B24B37/20;B24B37/24;B24D13/14;H01L21/304;H01L21/306;(IPC1-7):H01L21/304 |
主分类号 |
B24B1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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