发明名称 METHOD FOR FORMING STORAGE NODE CONTACT OF CAPACITOR
摘要 PURPOSE: A method for forming a storage node contact of a capacitor is provided to reduce loss of a stopping oxide layer and to restrain dishing of polysilicon by polishing the polysilicon using the stopping oxide layer. CONSTITUTION: An insulating layer(7) with a contact hole is formed on a semiconductor substrate. The first storage node contact(8) is formed by filling a polysilicon layer in the contact hole. A stopping oxide layer(10) is formed on the resultant structure. An opening part is formed by selectively etching the stopping oxide layer. The second storage node contact(9) is formed by filling a polysilicon layer in the opening part and polishing the polysilicon layer to expose the stoppling oxide layer.
申请公布号 KR20040059964(A) 申请公布日期 2004.07.06
申请号 KR20020086472 申请日期 2002.12.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 NOH, YONG JU
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
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