发明名称 |
Test probe for electrical devices having low or no wedge depression |
摘要 |
A probe for use in detecting abnormalities in an electrical device having a wedge depression of no more than 100 mils. The probe includes a solid core surrounded by a sense coil. The ends of the core are arranged in a contact-free, spaced relationship between and at least partially above opposed surfaces of adjacent lamination teeth of a stator. Air gaps are maintained between the ends of the probe core and the opposed surfaces. The total of the two air gaps is constant. The probe is supported on a carriage arrangement and moved along the teeth. Variations in leakage flux produced with the stator energized with an energization winding to produce a flux which is a few percent of a normal energization level, are monitored.
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申请公布号 |
US2004100300(A1) |
申请公布日期 |
2004.05.27 |
申请号 |
US20030717533 |
申请日期 |
2003.11.20 |
申请人 |
GENERAL ELECTRIC COMPANY |
发明人 |
LEE SANG-BIN;KLIMAN GERALD BURT;MALL WAHEED TONY |
分类号 |
G01N27/83;G01M99/00;G01R1/067;G01R31/34;(IPC1-7):G01R31/34 |
主分类号 |
G01N27/83 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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