发明名称 Test probe for electrical devices having low or no wedge depression
摘要 A probe for use in detecting abnormalities in an electrical device having a wedge depression of no more than 100 mils. The probe includes a solid core surrounded by a sense coil. The ends of the core are arranged in a contact-free, spaced relationship between and at least partially above opposed surfaces of adjacent lamination teeth of a stator. Air gaps are maintained between the ends of the probe core and the opposed surfaces. The total of the two air gaps is constant. The probe is supported on a carriage arrangement and moved along the teeth. Variations in leakage flux produced with the stator energized with an energization winding to produce a flux which is a few percent of a normal energization level, are monitored.
申请公布号 US2004100300(A1) 申请公布日期 2004.05.27
申请号 US20030717533 申请日期 2003.11.20
申请人 GENERAL ELECTRIC COMPANY 发明人 LEE SANG-BIN;KLIMAN GERALD BURT;MALL WAHEED TONY
分类号 G01N27/83;G01M99/00;G01R1/067;G01R31/34;(IPC1-7):G01R31/34 主分类号 G01N27/83
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