发明名称 DISTURBANCE MEASURING DEVICE IN OPTICAL INTERFEROMETER, AND HIGH-PRECISION LIGHT INTERFERENCE MEASURING ARRANGEMENT
摘要 PROBLEM TO BE SOLVED: To provide a device which quantitatively evaluates the errors in a measured value caused by disturbance, and reduces its measurement error to an allowance or less, on the basis of that result, in measurement using an optical interferometer. SOLUTION: A disturbance measuring device and a measuring device which uses the measured values, cause object light and reference light to have between them a phase difference which changes in the shape of a sawtooth wave, as a result cause the intensity of their interference light to change sinusoidally, in an interference optical system, measure the phase difference by utilizing that fact, and sample that phase difference by a predetermined frequency. In doing this, the frequency characteristics of the quantity of the error of the measured value caused by the disturbance can be evaluated. Moreover, the spatial distribution of the quantity of the error of the measured value caused by the disturbance can be evaluated, by dividing the interference light into two luminous fluxes, forming apertures at positions where the respective luminous fluxes correspond to different portions of a measuring object, and measuring the phase difference between the interference lights which have passed the apertures. On the basis of the result, the frequency of the phase difference in the shape of a saw toothwave necessary for attaining measurement accuracy is decided. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004150965(A) 申请公布日期 2004.05.27
申请号 JP20020316985 申请日期 2002.10.31
申请人 NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY 发明人 YAMAUCHI MAKOTO
分类号 G01B9/02;(IPC1-7):G01B9/02 主分类号 G01B9/02
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