发明名称 POLYMER COMPOUND, POSITIVE-TYPE RESIST MATERIAL AND PATTERN FORMING METHOD USING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a positive-type resist material, particularly a chemically-amplified, positive-type resist material, having a high resolution, margin of exposure, a small difference between sparse and dense dimensions, and process adaptability, surpassing those of conventional positive-type resist materials, furnishing a good pattern shape on exposure, and showing excellent etching resistance. <P>SOLUTION: A polymer compound having at least a repeating unit for copolymerization represented by general formula (1), and having a weight-average molecular weight of 1,000-500,000 is formulated as a base resin into the positive-type resist material. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2004115630(A) 申请公布日期 2004.04.15
申请号 JP20020279854 申请日期 2002.09.25
申请人 SHIN ETSU CHEM CO LTD 发明人 HATAKEYAMA JUN;KUSAKI WATARU;TAKEDA TAKANOBU;WATANABE OSAMU
分类号 G03F7/039;C08F212/14;C08F232/08;C08F234/02;C08F234/04;H01L21/027 主分类号 G03F7/039
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