发明名称 |
MIS TYPE TRANSISTOR ELEMENT USING VOLATILE RAW MATERIAL AND SEMICONDUCTOR DEVICE HAVING IT |
摘要 |
PROBLEM TO BE SOLVED: To provide a volatile raw material for an MIS type semiconductor element which is fixed-charge free, can be supplied stably to a gate insulation film for ensuring the capacitance of a fined gate transistor by restraining a leak current and can restrain impurities in a formed film. SOLUTION: In the MIS (Metal Insulator Semiconductor) type transistor element, a silicon single crystalline substrate is used for its base material. A gate insulation film of a semiconductor element is formed of the volatile raw material expressed by Hf(NO<SB>3</SB>)<SB>4</SB>×L (wherein L is molecular base) by a chemical vapor-phase growth method or an atomic layer control growth method. COPYRIGHT: (C)2004,JPO
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申请公布号 |
JP2004111832(A) |
申请公布日期 |
2004.04.08 |
申请号 |
JP20020275532 |
申请日期 |
2002.09.20 |
申请人 |
HITACHI LTD;MITSUBISHI ELECTRIC CORP |
发明人 |
NAMATAME TOSHIHIDE;HORIKAWA TAKESHI;KINOSHITA ISAMU;ISOBE KIYOSHI |
分类号 |
H01L21/316;H01L29/78;(IPC1-7):H01L29/78 |
主分类号 |
H01L21/316 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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