发明名称 SEMICONDUCTOR DEVICE WITH GATE SPACER OF POSITIVE SLOPE AND FABRICATING METHOD THEREOF
摘要 PURPOSE: A method for fabricating a semiconductor device with a gate spacer of a positive slope is provided to prevent a bridge from being generated by residual polysilicon by forming a positive slope in a gate spacer while using a wet etch difference of a spacer insulation layer. CONSTITUTION: A plurality of gates are formed on a semiconductor substrate. A gate spacer is formed so as to have a positive slope at the edge of the gate. A polysilicon layer(240) is formed on the substrate to fill a gap between the gates. A part of the polysilicon layer is etched to form an opening exposing the substrate. An interlayer dielectric(260) is formed on the exposed substrate so as to fill the opening.
申请公布号 KR20040016070(A) 申请公布日期 2004.02.21
申请号 KR20020048267 申请日期 2002.08.14
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JUNG, MUN MO;KIM, UK JE;LEE, CHANG HEON
分类号 H01L21/336;H01L21/8234;(IPC1-7):H01L21/336 主分类号 H01L21/336
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