发明名称 |
SEMICONDUCTOR DEVICE WITH GATE SPACER OF POSITIVE SLOPE AND FABRICATING METHOD THEREOF |
摘要 |
PURPOSE: A method for fabricating a semiconductor device with a gate spacer of a positive slope is provided to prevent a bridge from being generated by residual polysilicon by forming a positive slope in a gate spacer while using a wet etch difference of a spacer insulation layer. CONSTITUTION: A plurality of gates are formed on a semiconductor substrate. A gate spacer is formed so as to have a positive slope at the edge of the gate. A polysilicon layer(240) is formed on the substrate to fill a gap between the gates. A part of the polysilicon layer is etched to form an opening exposing the substrate. An interlayer dielectric(260) is formed on the exposed substrate so as to fill the opening.
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申请公布号 |
KR20040016070(A) |
申请公布日期 |
2004.02.21 |
申请号 |
KR20020048267 |
申请日期 |
2002.08.14 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JUNG, MUN MO;KIM, UK JE;LEE, CHANG HEON |
分类号 |
H01L21/336;H01L21/8234;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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