发明名称 SEMICONDUCTOR SUBSTRATE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor substrate that can be improved in heat radiating property, and to provide a method of manufacturing the substrate. SOLUTION: The semiconductor substrate has a silicon substrate 10, a silicon-germanium layer 12 formed on the substrate 10, and a silicon layer 14 formed on the layer 12. At least either of an isotopic composition ratio of an Si isotope and that of a Ge isotope in at least one of the silicon substrate, silicon-germanium layer, and silicon layer is adjusted to≥95%. Since at least either of the isotopic composition ratio of the Si isotope and Ge isotope is set higher in at least one of the silicon substrate, silicon-germanium layer, and silicon layer, the dissipation of heat can be accelerated in a horizontal direction with respect to the surface of the substrate 10. Therefore, the semiconductor substrate can be improved in heat radiating property. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004039735(A) 申请公布日期 2004.02.05
申请号 JP20020192133 申请日期 2002.07.01
申请人 FUJITSU LTD 发明人 FUKUDA TETSUO;HIRATA KATSUSHI
分类号 H01L21/02;H01L21/20;H01L21/205;H01L21/336;H01L21/762;H01L21/84;H01L27/12;H01L29/04;H01L29/10;H01L29/161;H01L29/165;H01L29/78;H01L29/786;(IPC1-7):H01L29/161 主分类号 H01L21/02
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