发明名称 METHOD FOR MANUFACTURING PHASE SHIFT MASK OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a phase shift mask of a semiconductor device is provided to be capable of increasing the contrast between a phase shift region and a phase non-shift region. CONSTITUTION: A phase shift layer and a translucent layer are formed at the upper portion of a transparent substrate(11). A photoresist pattern(17) is formed at the upper portion of the resultant structure. A translucent pattern(16) and a phase shift pattern(14) are sequentially formed by selectively etching the resultant structure using the photoresist pattern as an etching mask. An under-cut portion is formed at the lateral portion of the translucent pattern by carrying out an etching process. Then, the photoresist pattern is removed.
申请公布号 KR20040008465(A) 申请公布日期 2004.01.31
申请号 KR20020042104 申请日期 2002.07.18
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, SEO MIN;LIM, CHANG MUN
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
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