发明名称 |
METHOD FOR MANUFACTURING PHASE SHIFT MASK OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a phase shift mask of a semiconductor device is provided to be capable of increasing the contrast between a phase shift region and a phase non-shift region. CONSTITUTION: A phase shift layer and a translucent layer are formed at the upper portion of a transparent substrate(11). A photoresist pattern(17) is formed at the upper portion of the resultant structure. A translucent pattern(16) and a phase shift pattern(14) are sequentially formed by selectively etching the resultant structure using the photoresist pattern as an etching mask. An under-cut portion is formed at the lateral portion of the translucent pattern by carrying out an etching process. Then, the photoresist pattern is removed.
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申请公布号 |
KR20040008465(A) |
申请公布日期 |
2004.01.31 |
申请号 |
KR20020042104 |
申请日期 |
2002.07.18 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, SEO MIN;LIM, CHANG MUN |
分类号 |
H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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