发明名称 Method for plasma etching of high-K dielectric materials
摘要 A method of etching high dielectric constant materials (a material with a dielectric constant greater than 4) using a halogen gas, reducing gas, and passivating gas chemistry. An embodiment of the method is accomplished using chlorine, carbon monoxide, and nitrogen to etch and passivate a hafnium dioxide layer.
申请公布号 US2004002223(A1) 申请公布日期 2004.01.01
申请号 US20020184301 申请日期 2002.06.26
申请人 APPLIED MATERIALS, INC. 发明人 NALLAN PADMAPANI C.;KUMAR AJAY
分类号 H01L21/28;H01L21/311;(IPC1-7):H01L21/302;H01L21/461 主分类号 H01L21/28
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