发明名称 LABEL INSPECTION METHOD AND LABEL INSPECTION DEVICE
摘要 A label inspection method and an inspection device which can positively detect the damaged condition of a label (L) even when the label (L) is transparent or semi-transparent, and positively detect the positional deviation of the label (L) from a container (B) when the label (L) is attached to the container (B), and which irradiates the label (L) as an object of inspection with an inspection light and receives the inspection light after irradiation to inspect the condition of the label (L), wherein a UV absorbing function or an IR absorbing function is imparted to the label (L), a UV ray- or IR ray-containing light is used as an inspection light, and an inspection light after applied to the label (L)is received for inspecting; an inspection method and an inspection device, wherein a UV fluorescent function is imparted to the label (L), a UV ray-containing light is used as an inspection light, and a reflection light after applied to the label (L) is receive for inspecting; and a method , wherein a polarizing function or a rotary polarizing function is imparted to the label (L), and an inspection light after applied to the label (L)is received for inspecting.
申请公布号 WO03104780(A1) 申请公布日期 2003.12.18
申请号 WO2003JP07095 申请日期 2003.06.04
申请人 SUNTORY LIMITED;KAMAKURA, RUI;YAMAGISHI, TAKAHIRO;OMURA, SHIGEO 发明人 KAMAKURA, RUI;YAMAGISHI, TAKAHIRO;OMURA, SHIGEO
分类号 G01B11/00;B65B57/02;G01N21/90;(IPC1-7):G01N21/90 主分类号 G01B11/00
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