| 发明名称 |
Method and apparatus for thermally investigating a material |
| 摘要 |
<p>A method and apparatus for thermally investigating a material by driving the material through a temperature profile composed of isothermal and non-isothermal segments is disclosed, which enable determination of a kinetic component in a measured heat flow signal caused by the exposure of the material to the temperature profile. <IMAGE></p> |
| 申请公布号 |
EP1371973(A1) |
申请公布日期 |
2003.12.17 |
| 申请号 |
EP20020012839 |
申请日期 |
2002.06.10 |
| 申请人 |
METTLER-TOLEDO GMBH |
发明人 |
JOERIMANN,URS;HUETTER,THOMAS |
| 分类号 |
G01N25/20;G01N25/48;(IPC1-7):G01N25/20 |
主分类号 |
G01N25/20 |
| 代理机构 |
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| 地址 |
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