| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device evaluator that significantly shortens time for measurement while ensuring high measurement accuracy when measuring output characteristics of a semiconductor device. SOLUTION: The semiconductor device evaluator comprises an earliest/last signal detection circuit 3 for inputting a test signal into a semiconductor device 1, receiving all signals DQ1 to DQn output parallel correspondingly from many respective output pins of the semiconductor device 1, and detecting signals respectively with the earliest and the last level variation from among the signals DQ1 to DQn; and phase difference measuring means 4 for capturing both the earliest signal and the last signal output from the earliest/last signal detection circuit 3 and measuring a phase difference between both signals. COPYRIGHT: (C)2004,JPO
|
