发明名称 |
On chip alpha-particle detector |
摘要 |
An IC chip comprising, a nearby or remote source capable of particle emissions; circuitry formed in the IC chip that is adversely affected by impacts of particle emissions from said source; and a particle detector formed in the IC chip between the circuitry and source for detecting said particle emissions. In one embodiment of the present invention, the source comprises a solder ball that is formed on a surface of the IC chip, and the solder ball is capable of emitting alpha-particles. The particle emissions detector of the present invention is a reverse biased Schottky diode. The IC chip is formed by (a) providing an IC chip having at least one layer of particle sensitive circuitry formed therein; (b) forming another layer having at least one particle sensor region situated therein on a surface of said IC chip; and (c) optionally, forming at least one particle emission source over said another layer.
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申请公布号 |
US6645789(B2) |
申请公布日期 |
2003.11.11 |
申请号 |
US20020246136 |
申请日期 |
2002.09.18 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
BERNSTEIN KERRY;BRYANT ANDRES;HOWELL WAYNE J.;KLAASEN WILLIAM A.;PRICER WILBUR D.;STAMPER ANTHONY K. |
分类号 |
G01T1/24;H01L21/00;H01L27/14;H01L27/146;H01L31/00;H01L31/115;H01L31/118;(IPC1-7):H01L21/00 |
主分类号 |
G01T1/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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