发明名称 On chip alpha-particle detector
摘要 An IC chip comprising, a nearby or remote source capable of particle emissions; circuitry formed in the IC chip that is adversely affected by impacts of particle emissions from said source; and a particle detector formed in the IC chip between the circuitry and source for detecting said particle emissions. In one embodiment of the present invention, the source comprises a solder ball that is formed on a surface of the IC chip, and the solder ball is capable of emitting alpha-particles. The particle emissions detector of the present invention is a reverse biased Schottky diode. The IC chip is formed by (a) providing an IC chip having at least one layer of particle sensitive circuitry formed therein; (b) forming another layer having at least one particle sensor region situated therein on a surface of said IC chip; and (c) optionally, forming at least one particle emission source over said another layer.
申请公布号 US6645789(B2) 申请公布日期 2003.11.11
申请号 US20020246136 申请日期 2002.09.18
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 BERNSTEIN KERRY;BRYANT ANDRES;HOWELL WAYNE J.;KLAASEN WILLIAM A.;PRICER WILBUR D.;STAMPER ANTHONY K.
分类号 G01T1/24;H01L21/00;H01L27/14;H01L27/146;H01L31/00;H01L31/115;H01L31/118;(IPC1-7):H01L21/00 主分类号 G01T1/24
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