发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT AND TEST METHOD FOR SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To enable specifying a defective place of a ROM holding secret of data incorporated in a ROM in a semiconductor integrated circuit in which a ROM with secret data stored is incorporated. SOLUTION: Data read out from a ROM 4 with secret data stored are ciphered by a ciphering circuit 5 using a key for test. And the data after ciphering are further ciphered by a second ciphering circuit 6, and the ciphered data are outputted from an external terminal. Also, when a defective place is specified, a program performing decoding of data is provided previously in a computer, it can be analyzed which bit of the ROM 4 is defective by decoding the data to a state before ciphering using the program. COPYRIGHT: (C)2004,JPO
申请公布号 JP2003303500(A) 申请公布日期 2003.10.24
申请号 JP20020103805 申请日期 2002.04.05
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 TAKEDA HIDEO
分类号 G01R31/28;G11C29/00;G11C29/12;(IPC1-7):G11C29/00 主分类号 G01R31/28
代理机构 代理人
主权项
地址