发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF, SOI SUBSTRATE AND MANUFACTURING METHOD THEREOF, AND DISPLAY DEVICE USING SOI SUBSTRATE
摘要 <p>A polycrystalline Si thin film and a single crystal Si thin film are formed on an SiO<SUB>2 </SUB>film deposited on an insulating substrate. A polycrystalline Si layer is grown by thermally crystallizing an amorphous Si thin film so as to form the polycrystalline Si thin film. A single crystal Si substrate, having (a) an SiO<SUB>2 </SUB>film thereon and (b) a hydrogen ion implantation portion therein, is bonded to an area of the polycrystalline Si thin film that has been subjected to etching removal, and is subjected to a heating process. Then, the single crystal Si substrate is divided at the hydrogen ion implantation portion in an exfoliating manner, so as to form the single crystal Si thin film. As a result, it is possible to provide a large-size semiconductor device, having the single crystal Si thin film, whose property is stable, at a low cost.</p>
申请公布号 KR20030077410(A) 申请公布日期 2003.10.01
申请号 KR20030018183 申请日期 2003.03.24
申请人 发明人
分类号 H01L21/20;H01L21/336;H01L21/762;H01L21/77;H01L21/84;H01L27/12;H01L29/786 主分类号 H01L21/20
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