Mass spectrometer ionisation gas samples analysis having electron beam generator/focussing and circular microchannel sections producing increased secondary electron beam and ionisation zone directing.

摘要

The mass spectrometer ion source has an electron gun (1) generating electrons (5) and forming an electron beam (7) towards a gas ionisation zone (16). Circular section microchannel sections (9,10) are placed in the electron beam, forming a pulsed electron beam of increased secondary electrons (12) from the original electron beam.