发明名称 CHARACTERISTICS ADJUSTING METHOD AND SEMICONDUCTOR DEVICE USING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a characteristic adjusting circuit, etc., capable of measuring the same characteristics before a fuse is blown out as those after it is blown out. SOLUTION: The adjusting circuit comprises a fuse 11 with a resistor 12 and a fuse 21 with a resistor 22, respectively connected in series between a first power potential VDD and a second power potential VSS; an inverter 13, having an input connected to the connection point of the fuse 11 and the resistor 12; an inverter 23, having an input connected to the connection point of the fuse 21 and the resistor 22; registers 14, 24 for holding one-bit data; a selector 15 for selecting the output of either the inverter 13 or the register 14 according to a switching signal; and a selector 25 for selecting an output of either the inverter 23 or the register 24 according to a switching signal. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003249562(A) 申请公布日期 2003.09.05
申请号 JP20020048463 申请日期 2002.02.25
申请人 SEIKO EPSON CORP 发明人 TAKAGI KATSUO
分类号 H01L27/04;H01L21/82;H01L21/822;(IPC1-7):H01L21/822 主分类号 H01L27/04
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