发明名称 METHOD OF MANUFACTURING CAPACITOR OF SEMICONDUCTOR DEVICE HAVING TA3N5 LAYER AS DIELECTRIC LAYER
摘要 PURPOSE: A method of manufacturing a capacitor of a semiconductor device having a Ta3N5 layer as dielectric layer is provided to use a Ta3N5 layer that do not require two step process and a high temperature thermal process. CONSTITUTION: A bottom electrode(110) is formed. A dielectric layer(120) consisting of Ta3N5 is formed on the bottom electrode by CVD. An upper electrode(130) is formed on the dielectric layer. A Ta3N5 layer is formed by pulsing a vaporized tantalum precursor and vaporized nitrogen source in a reaction chamber.
申请公布号 KR20030063643(A) 申请公布日期 2003.07.31
申请号 KR20020003873 申请日期 2002.01.23
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, GIL HYEON;CHOI, GYEONG IN;KANG, SANG BEOM;KIM, BYEONG HUI;LEE, CHANG WON
分类号 H01L27/04;(IPC1-7):H01L27/04 主分类号 H01L27/04
代理机构 代理人
主权项
地址