METHOD OF MANUFACTURING CAPACITOR OF SEMICONDUCTOR DEVICE HAVING TA3N5 LAYER AS DIELECTRIC LAYER
摘要
PURPOSE: A method of manufacturing a capacitor of a semiconductor device having a Ta3N5 layer as dielectric layer is provided to use a Ta3N5 layer that do not require two step process and a high temperature thermal process. CONSTITUTION: A bottom electrode(110) is formed. A dielectric layer(120) consisting of Ta3N5 is formed on the bottom electrode by CVD. An upper electrode(130) is formed on the dielectric layer. A Ta3N5 layer is formed by pulsing a vaporized tantalum precursor and vaporized nitrogen source in a reaction chamber.
申请公布号
KR20030063643(A)
申请公布日期
2003.07.31
申请号
KR20020003873
申请日期
2002.01.23
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
CHOI, GIL HYEON;CHOI, GYEONG IN;KANG, SANG BEOM;KIM, BYEONG HUI;LEE, CHANG WON