发明名称 CAPACITOR OF FERROELECTRIC MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 PURPOSE: A capacitor of a ferroelectric memory device and a method for manufacturing the same are provided to be capable of improving reliability by forming a Bi4Ti3O12(BIT) film between a BLT dielectric film and a lower electrode. CONSTITUTION: A lower electrode is formed on a semiconductor substrate. A BIT thin film is formed on the lower electrode. A BLT dielectric film is formed on the BIT thin film. An upper electrode is formed on the BLT dielectric film. At the time, the composition of the BIT thin film is Bi : Ti : O = 4 : 3 : 12. Also, the thickness of the BIT thin film is 200-500Å.
申请公布号 KR20030054045(A) 申请公布日期 2003.07.02
申请号 KR20010084133 申请日期 2001.12.24
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHOI, EUN SEOK;KIM, NAM GYEONG;YUM, SEUNG JIN
分类号 H01L27/105;(IPC1-7):H01L27/105 主分类号 H01L27/105
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