| 摘要 |
A method for measuring a test differential voltage across a first output and a second output of a transmitter integrated circuit device, the test differential voltage corresponding to a voltage across the first output and second output appearing while the device is providing an output while being subjected to a voltages applied across a resistor network connected to the differential outputs, the resistor network comprising a first resistor having a value of Ra connected between the first output a first voltage, a second resistor having a value of Rb connected between the second output and a second voltage, and a third resistor having a value of Rc connected between the first output and the second output. In the method, a first current is applied to the first output, the first current being of a magnitude determined to correspond to a magnitude of current that would appear at the first output while the device were providing an output while being subjected to said predetermined voltages applied across said resistor network. A second current is applied to the first output, the second current being of a magnitude determined to correspond to a magnitude of current that would appear at the second output while the device were providing an output while being subjected to said predetermined voltages applied across said resistor network. Finally, a test differential output voltage is measured across the first output and the second output.
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