SEMICONDUCTOR INTEGRATED CIRCUIT AND TEST METHOD OF THE SAME

摘要

PROBLEM TO BE SOLVED: To enable tests through the use of a tester of a relatively slow operating speed without separately preparing a memory dedicated to the tests for a semiconductor integrated circuit. SOLUTION: The semiconductor integrated circuit (1) performs both real operation through the use of a predetermined function included in the semiconductor integrated circuit and test operation for verifying whether the predetermined function is attained or not. The semiconductor integrated circuit comprises logic circuits (2L and 3L) as a plurality of real operating circuit blocks operable by the real operation and memories (2M and 3M). Attention is given to an on-chip memory which is not specified as an object to be tested and is not used in test mode. A test control circuit (5) previously stores a test pattern comprised of a test input line and a test estimated value line in the unused memory from the tester. The stored test pattern is utilized to implement an on-chip test function for independently performing tests inside the semiconductor integrated circuit. It is possible to perform real operating frequency tests by the low-end and relatively low-speed tester.