发明名称 Memory cell
摘要 <p>A one-time programmable memory cell (100, 300) including a fuse (130, 330) and an anti-fuse (180, 380) in series, has two states, an initial state and a written (programmed) state. In the initial state, a resistance of the cell is finite, typically dominated by the relatively high resistance of the anti-fuse. In the written state, the resistance is infinite because the breakdown of the fuse resulting in an open circuit. The cell (100, 300) may be programmed by applying a critical voltage across the cell (100, 300) generating a critical current to cause the fuse (130, 330) to become open. When critical voltage is applied, this generally causes the anti-fuse (180, 380) to break down, which in turn causes a pulse of high current to be applied to the fuse. The states are detected by applying a read voltage across the memory cell. If the memory has not been programmed, then a measurable amount flows. Otherwise, no current flows.</p>
申请公布号 EP1298729(A2) 申请公布日期 2003.04.02
申请号 EP20020256631 申请日期 2002.09.25
申请人 HEWLETT-PACKARD COMPANY 发明人 ANTHONY, THOMAS C.
分类号 H01L21/82;H01L23/525;H01L27/10;H01L27/105;(IPC1-7):H01L27/10 主分类号 H01L21/82
代理机构 代理人
主权项
地址