发明名称 Chemical method for producing smooth surfaces on silicon wafers
摘要 An improved method for producing optically smooth surfaces in silicon wafers during wet chemical etching involves a pre-treatment rinse of the wafers before etching and a post-etching rinse. The pre-treatment with an organic solvent provides a well-wetted surface that ensures uniform mass transfer during etching, which results in optically smooth surfaces. The post-etching treatment with an acetic acid solution stops the etching instantly, preventing any uneven etching that leads to surface roughness. This method can be used to etch silicon surfaces to a depth of 200 mum or more, while the finished surfaces have a surface roughness of only 15-50 Å (RMS).
申请公布号 US6514875(B1) 申请公布日期 2003.02.04
申请号 US19970846196 申请日期 1997.04.28
申请人 THE REGENTS OF THE UNIVERSITY OF CALIFORNIA 发明人 YU CONRAD
分类号 H01L21/302;H01L21/306;(IPC1-7):H01L21/302 主分类号 H01L21/302
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