发明名称 APPARATUS FOR DETECTING OFFSET VOLTAGE OF SENSE AMPLIFIER AND METHOD FOR THE SAME
摘要 PURPOSE: An apparatus for detecting an offset voltage of a sense amplifier and a method for the same are provided to measure the offset voltage by applying a bit line precharge voltage to a cell, wherein the operation of a sense amplifier is stopped by generating an offset voltage detection test mode entry signal and only enabling precharge signal. CONSTITUTION: An apparatus for detecting an offset voltage of a sense amplifier includes an order decoder(110) for generating a mode register setting order signal(MRS) by receiving an external clock signal(CLK) and a plurality of external control signals(/CS,/RAS,/CAS,/WE), a test controller(120) for generating a test mode entry signal by receiving the mode register setting order signal(MRS) generated at the order decoder(110) and an external address, a test mode decoder(130) for generating an offset voltage detection test mode entry signal(TM_OFFSET) by receiving the test mode entry signal(TM) generated at the test controller(120) and the external address, a sense amplifying controller(150) for generating a bitline precharge signal(BL_PRE) in response to the offset voltage detection test mode entry signal generated at the test mode decoder(130), a sense amplifying driver controller(160) for generating a first and a second sense amplifying enable control signals by receiving the offset voltage detection test mode entry signal(TM_OFFSET) generated at the sense amplifying driver controller(160) and a sense amplifying driver(170) for generating a first and a second sense amplifying enable signals by receiving the bitline precharge generated at the sense amplifying controller(150) and the first and the second sense amplifying enable control signals generated at the sense amplifying driver controller(160).
申请公布号 KR20030002272(A) 申请公布日期 2003.01.08
申请号 KR20010039046 申请日期 2001.06.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, SANG GWON
分类号 G11C29/00;(IPC1-7):G11C29/00 主分类号 G11C29/00
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