发明名称 INDICATOR OF LOCATION OF X-RAY IRRADIATION AND X-RAY SPECTROSCOPE
摘要 <p>PROBLEM TO BE SOLVED: To accurately analyze a target location by accurately positioning the location of X-ray irradiation and a location of analysis. SOLUTION: X rays and visible light are shone through one optical member 2. By accurately positioning the location of the X-ray irradiation and the location of analysis by the location of the visible light irradiation shone to the same location as the location of the X-ray irradiation, the target location is accurately analyzed. This indicator 1 for indicating the location of the X-ray irradiation is provided with the optical member 2 for condensing the X rays and the visible light shone from the same opening onto the same location. When the X rays and the visible light are shone through the optical member 2, the location of the X-ray irradiation shone onto a sample and the location of the visible light irradiation become the same location.</p>
申请公布号 JP2003004677(A) 申请公布日期 2003.01.08
申请号 JP20010192469 申请日期 2001.06.26
申请人 SHIMADZU CORP 发明人 MORI YUJI
分类号 G01N23/227;G01N23/223;(IPC1-7):G01N23/227 主分类号 G01N23/227
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