发明名称 APPARATUS FOR AND METHOD OF MEASURING JITTER
摘要 A signal under measurement x(t) is transformed into a complex analytic signal zc(t), and an instantaneous phase of the xc(t) is estimated using the zc(t). A linear phase is removed from the instantaneous phase to obtain a phase noise waveform Δ PHI (t) of the x(t), and the Δ PHI (t) is sampled at a timing close t o a zero-crossing timing of the x(t) to obtain a timing jitter sequence. Then a difference sequence of the timing jitter sequence is calculated to obtain a period jitter sequence. The period jitter sequence is multiplied by a ratio T0/Tk,k+1 of the fundamental period T0 of the x(t) and the sampling time interval Tk,k+1 to make a correction of the period jitter sequence. A period jitter value of the x(t) is obtained from the corrected period jitter sequence.
申请公布号 WO02076008(A3) 申请公布日期 2002.12.12
申请号 WO2002JP02163 申请日期 2002.03.08
申请人 ADVANTEST CORPORATION 发明人 YAMAGUCHI, TAKAHIRO;ISHIDA, MASAHIRO;SOMA, MANI
分类号 G01R29/02;G01R29/027;G01R29/26;H03K5/26;H04L1/20 主分类号 G01R29/02
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