发明名称 |
APPARATUS FOR AND METHOD OF MEASURING JITTER |
摘要 |
A signal under measurement x(t) is transformed into a complex analytic signal zc(t), and an instantaneous phase of the xc(t) is estimated using the zc(t). A linear phase is removed from the instantaneous phase to obtain a phase noise waveform Δ PHI (t) of the x(t), and the Δ PHI (t) is sampled at a timing close t o a zero-crossing timing of the x(t) to obtain a timing jitter sequence. Then a difference sequence of the timing jitter sequence is calculated to obtain a period jitter sequence. The period jitter sequence is multiplied by a ratio T0/Tk,k+1 of the fundamental period T0 of the x(t) and the sampling time interval Tk,k+1 to make a correction of the period jitter sequence. A period jitter value of the x(t) is obtained from the corrected period jitter sequence. |
申请公布号 |
WO02076008(A3) |
申请公布日期 |
2002.12.12 |
申请号 |
WO2002JP02163 |
申请日期 |
2002.03.08 |
申请人 |
ADVANTEST CORPORATION |
发明人 |
YAMAGUCHI, TAKAHIRO;ISHIDA, MASAHIRO;SOMA, MANI |
分类号 |
G01R29/02;G01R29/027;G01R29/26;H03K5/26;H04L1/20 |
主分类号 |
G01R29/02 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|