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发明名称
ON-CHIP CIRCUIT AND METHOD FOR TESTING MEMORY DEVICES
摘要
申请公布号
EP1084497(B1)
申请公布日期
2002.12.04
申请号
EP19990928527
申请日期
1999.06.11
申请人
MICRON TECHNOLOGY, INC.
发明人
PIERCE, KIM, M.;INGALLS, CHARLES, L.
分类号
G11C29/14;G11C29/38;(IPC1-7):G11C29/00
主分类号
G11C29/14
代理机构
代理人
主权项
地址
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