发明名称 Single-chip microcomputer with dynamic burn-in test function and dynamic burn-in testing method therefor
摘要 In a single-chip microcomputer including a nonvolatile semiconductor memory device and write, read and erase circuits for performing a write operation, a read operation and an erase operation upon the nonvolatile semiconductor memory device, respectively, a sequencer is connected between the write, read and erase circuits and an interface. The sequencer receives first data via the interface from the exterior to write the first data into the nonvolatile semiconductor memory device, reads the first data from the nonvolatile semiconductor device, compares the first data with second data read via the interface from the exterior thus performing a verification upon the nonvolatile semiconductor memory device, and reads third data from the nonvolatile semiconductor memory device and transmits the third data via the interface to the exterior.
申请公布号 US2002161963(A1) 申请公布日期 2002.10.31
申请号 US20020128962 申请日期 2002.04.24
申请人 NEC CORPORATION 发明人 KAMIMURA RYOHEI
分类号 G01R31/28;G06F11/22;G06F12/16;G06F15/78;G11C16/02;G11C17/00;G11C29/00;G11C29/02;G11C29/06;G11C29/14;(IPC1-7):G06F12/00 主分类号 G01R31/28
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