发明名称 |
SPECTRALLY SHAPED X-RAY INSPECTION SYSTEM |
摘要 |
A system and methods for non-invasive x-ray inspection of an enclosure in such a manner as to reduce the ambient radiation dose to below a specified level. A beam spectrally filtered to emphasize a high-energy component of penetrating radiation is interleaved, temporally, with a beam dominated by a low-energy component. Thus both lightly loaded and heavily loaded cargo may be inspected while limiting the ambient scattered radiation.
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申请公布号 |
WO0159485(A9) |
申请公布日期 |
2002.10.24 |
申请号 |
WO2001US04143 |
申请日期 |
2001.02.09 |
申请人 |
AMERICAN SCIENCE AND ENGINEERING, INC. |
发明人 |
GRODZINS, LEE;ROTHSCHILD, PETER |
分类号 |
G01N23/02;G01N23/20;G01V5/00;(IPC1-7):G01V5/00 |
主分类号 |
G01N23/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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