发明名称 |
TERMINAL AND DEVICE FOR MEASURING CHIP COMPONENT |
摘要 |
PROBLEM TO BE SOLVED: To extremely compactly construct the body part of a measuring terminal by using wire-rope split pieces each having a shape obtained by splitting a wire rope into two and enabling the two split pieces to abut on narrow electrode parts of an extremely small chip component. SOLUTION: The body part of this measuring terminal for measuring the electrical characteristics of the chip component 1 by abutting on the terminal electrode parts of the chip component 1 comprises the wire-rope split pieces 10 and 11 each having a shape obtained by splitting a wire rope into two by a plane passing through its center axis. End faces of end parts of the split pieces 10 and 11 abut on the electrode parts, respectively, and their peripheral surfaces excluding the end faces are each covered with a DLC(diamond-like carbon) thin film 20 as an abrasion-resistant hard insulating thin film. Split planes of the split pieces 10 and 11 are brought into contact with each other through the thin films 20. The split pieces are axially slidable on each other and severally urged toward their front ends by urging means.
|
申请公布号 |
JP2002243760(A) |
申请公布日期 |
2002.08.28 |
申请号 |
JP20010039573 |
申请日期 |
2001.02.16 |
申请人 |
TDK CORP |
发明人 |
KYOGOKU TAKASHI;ABE KIYOHIKO |
分类号 |
G01R1/073;G01R31/00;G01R31/28;(IPC1-7):G01R1/073 |
主分类号 |
G01R1/073 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|