发明名称 Coherent x-ray scatter inspection system with sidescatter and energy-resolved detection
摘要 A system and method for inspecting an enclosure. A beam of x-rays is used for scanning the enclosure and for identifying areas of suspect material. The beam is subsequently coherently scattered off suspect materials, during the course of a single pass of the enclosure past the beam, for uniquely discriminating innocuous from contraband substances. One or more energy dispersive detectors measure radiation coherently scattered by an identified volume of suspect material. Absorption effects of the energy distribution of the coherently scattered radiation are compensated by means of a fiducial reference disposed between the interrogated object and the detectors.
申请公布号 US6442233(B1) 申请公布日期 2002.08.27
申请号 US20000637755 申请日期 2000.08.11
申请人 AMERICAN SCIENCE AND ENGINEERING, INC. 发明人 GRODZINS LEE;ADAMS WILLIAM;ROTHSCHILD PETER
分类号 G01N23/201;G01V5/00;(IPC1-7):G01N23/04 主分类号 G01N23/201
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