发明名称 METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method for fabricating a semiconductor device, in which generation of defectives are suppressed by stabilizing etching property. SOLUTION: The semiconductor device is produced by forming contact hole on the insulation film on a patterned silicon substrate using an semiconductor fabricating equipment having at least a reaction chamber for generating plasma. The plasma comprised of argon and oxygen is generated (step S1) in the reaction chamber of the semiconductor fabricating equipment before a contact hole (step S3) in the insulation film on the semiconductor substrate is formed.
申请公布号 JP2002217167(A) 申请公布日期 2002.08.02
申请号 JP20010005485 申请日期 2001.01.12
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 JIWARI NOBUHIRO;IMAI SHINICHI
分类号 H01L21/28;H01L21/302;H01L21/3065;H01L21/768;(IPC1-7):H01L21/306 主分类号 H01L21/28
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