发明名称 |
METHOD FOR FABRICATING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for fabricating a semiconductor device, in which generation of defectives are suppressed by stabilizing etching property. SOLUTION: The semiconductor device is produced by forming contact hole on the insulation film on a patterned silicon substrate using an semiconductor fabricating equipment having at least a reaction chamber for generating plasma. The plasma comprised of argon and oxygen is generated (step S1) in the reaction chamber of the semiconductor fabricating equipment before a contact hole (step S3) in the insulation film on the semiconductor substrate is formed.
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申请公布号 |
JP2002217167(A) |
申请公布日期 |
2002.08.02 |
申请号 |
JP20010005485 |
申请日期 |
2001.01.12 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
JIWARI NOBUHIRO;IMAI SHINICHI |
分类号 |
H01L21/28;H01L21/302;H01L21/3065;H01L21/768;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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